发明名称 CHARGE-INTEGRATION MULTILINEAR IMAGE SENSOR
摘要 <p>The invention relates to linear time-delay and integration sensors (or TDI sensors). According to the invention, adjacent pixels of the same rank comprise, alternately, at least one photodiode and one transfer gate adjacent to the photodiode, the photodiodes comprising a common reference region of a first conductivity type, in which an individual region of opposite conductivity type is formed, itself covered by a individual surface region of the first conductivity type, characterized in that the surface regions of two photodiodes located on either side of a transfer gate are electrically separated so as to be able to be brought to different potentials in order to create potential wells and potential barriers allowing accumulation and transfer of charges as desired.</p>
申请公布号 EP2510545(B1) 申请公布日期 2013.08.07
申请号 EP20100787739 申请日期 2010.12.02
申请人 E2V SEMICONDUCTORS 发明人 MAYER, FREDERIC
分类号 H01L27/148 主分类号 H01L27/148
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