发明名称 Integrated circuit including detection circuit to detect electrical energy delivered by a thermoelectric material
摘要 An integrated circuit includes active circuitry disposed at a surface of a semiconductor body and an interconnect region disposed above the semiconductor body. A thermoelectric material is disposed in an upper portion of the interconnect region away from the semiconductor body. The thermoelectric material is configured to deliver electrical energy when exposed to a temperature gradient. This material can be used, for example, in a method for detecting the repackaging of the integrated circuit after it has been originally packaged.
申请公布号 US8502383(B2) 申请公布日期 2013.08.06
申请号 US201113243620 申请日期 2011.09.23
申请人 FORNARA PASCAL;RIVERO CHRISTIAN;STMICROELECTRONICS (ROUSSET) SAS 发明人 FORNARA PASCAL;RIVERO CHRISTIAN
分类号 H01L23/48;H01L23/52;H01L27/10;H01L29/40;H01L29/73;H01L29/74 主分类号 H01L23/48
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