发明名称 LIFETIME EVALUATION DEVICE WITH TEMPERATURE HISTORY, AND IRON HEAD TEMPERATURE MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a lifetime evaluation device with a temperature history capable of rationally determining the lifetime of a temperature sensor in an iron head temperature measurement device.SOLUTION: A lifetime evaluation device includes: a temperature sensor 201; time measurement means (a timer 207) for measuring a lapsed time for the detection of temperature when the temperature sensor detects a fixed level or more temperature; evaluation value calculation means (an arithmetic part 202) for calculating an evaluation value to be greater as temperature is higher and a time is longer on the basis of both data of the temperature detected by the temperature sensor and the time measured by the time measurement means; integration means (the arithmetic part 202) for calculating an integration value of the evaluation value whenever the temperature sensor detects a fixed level or more temperature; storage means (a storage part 203) for storing by updating an integration value calculated by the integration means; and alarm means (the arithmetic part 202) for generating an alarm signal when the integration value of the evaluation value exceeds a predetermined lifetime value.
申请公布号 JP2013148370(A) 申请公布日期 2013.08.01
申请号 JP20120007045 申请日期 2012.01.17
申请人 TAIYO DENKI SANGYO KK 发明人 YOSHIHARA FUMIHARU
分类号 G01N17/00;B23K1/00;B23K3/02;B23K101/42;G01N25/00 主分类号 G01N17/00
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