发明名称 |
LIFETIME EVALUATION DEVICE WITH TEMPERATURE HISTORY, AND IRON HEAD TEMPERATURE MEASUREMENT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a lifetime evaluation device with a temperature history capable of rationally determining the lifetime of a temperature sensor in an iron head temperature measurement device.SOLUTION: A lifetime evaluation device includes: a temperature sensor 201; time measurement means (a timer 207) for measuring a lapsed time for the detection of temperature when the temperature sensor detects a fixed level or more temperature; evaluation value calculation means (an arithmetic part 202) for calculating an evaluation value to be greater as temperature is higher and a time is longer on the basis of both data of the temperature detected by the temperature sensor and the time measured by the time measurement means; integration means (the arithmetic part 202) for calculating an integration value of the evaluation value whenever the temperature sensor detects a fixed level or more temperature; storage means (a storage part 203) for storing by updating an integration value calculated by the integration means; and alarm means (the arithmetic part 202) for generating an alarm signal when the integration value of the evaluation value exceeds a predetermined lifetime value. |
申请公布号 |
JP2013148370(A) |
申请公布日期 |
2013.08.01 |
申请号 |
JP20120007045 |
申请日期 |
2012.01.17 |
申请人 |
TAIYO DENKI SANGYO KK |
发明人 |
YOSHIHARA FUMIHARU |
分类号 |
G01N17/00;B23K1/00;B23K3/02;B23K101/42;G01N25/00 |
主分类号 |
G01N17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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