发明名称 Scanning Measurements On Generalized Grids
摘要 A scanning measurement apparatus and method comprising a device under test for receiving or transmitting a signal, a measurement probe, a robot for moving the device or the probe relative to one another to scan continuously over a two-dimensional planar, cylindrical or spherical surface in a three-dimensional space, and a controller for obtaining measurement samples at generalized grid points on the two-dimensional surface computing characteristic coefficients from the measured values, wherein the characteristic coefficients are recovered using a conjugate gradient method, using in part an unequally spaced fast Fourier transform or using a conjugate gradient method and an unequally spaced fast Fourier transform.
申请公布号 US2013187814(A1) 申请公布日期 2013.07.25
申请号 US201313734890 申请日期 2013.01.04
申请人 DIREENTECH, INC.;DIREENTECH, INC. 发明人 DIREEN RANDAL HUGH
分类号 G01R29/10 主分类号 G01R29/10
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