| 摘要 |
PROBLEM TO BE SOLVED: To provide a handler device capable of shortening the testing time.SOLUTION: A handler device conveys a plurality of devices to be tested to sockets for testing. The handler device comprises: a testing section where the sockets are provided; a heat applying section that receives a tray mounted with the plurality of devices to be tested on a surface, controls the temperature of the plurality of devices to be tested at a predetermined testing temperature, and conveys the tray to the testing section; a device imaging section that moves in the heat applying section in first and second directions which are not parallel to each other, relatively with respect to the surface of the tray, and captures an image of each device to be tested; and a position adjustment section that adjusts the position of each of the plurality of devices to be tested with respect to the corresponding socket on the basis of the image of each of the plurality of devices to be tested captured by the device capturing section. |
