发明名称 |
Method for the production of a semiconductor structure |
摘要 |
Semiconductor structures are produced by providing a 3C-SiC semiconductor layer containing a monocrystalline 3C-SiC layer by implantation of carbon in silicon on a first silicon substrate and applying an epitaxial layer of nitride compound semiconductor suitable for the generation of optoelectronic components onto the 3C-SiC semiconductor layer structure, wherein the epitaxial layer of nitride semiconductor is transferred onto a second substrate by bonding the nitride layer onto the second substrate surface and mechanically or chemically removing silicon and layers containing SiC, the second substrate being a metal with a reflectivity >=80% or being substantially transparent.
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申请公布号 |
US8492243(B2) |
申请公布日期 |
2013.07.23 |
申请号 |
US20090863506 |
申请日期 |
2009.01.21 |
申请人 |
HAEBERLEN MAIK;MURPHY BRIAN;SILTRONIC AG |
发明人 |
HAEBERLEN MAIK;MURPHY BRIAN |
分类号 |
H01L21/30;H01L33/00;H01L33/46 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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