发明名称 Method for the production of a semiconductor structure
摘要 Semiconductor structures are produced by providing a 3C-SiC semiconductor layer containing a monocrystalline 3C-SiC layer by implantation of carbon in silicon on a first silicon substrate and applying an epitaxial layer of nitride compound semiconductor suitable for the generation of optoelectronic components onto the 3C-SiC semiconductor layer structure, wherein the epitaxial layer of nitride semiconductor is transferred onto a second substrate by bonding the nitride layer onto the second substrate surface and mechanically or chemically removing silicon and layers containing SiC, the second substrate being a metal with a reflectivity >=80% or being substantially transparent.
申请公布号 US8492243(B2) 申请公布日期 2013.07.23
申请号 US20090863506 申请日期 2009.01.21
申请人 HAEBERLEN MAIK;MURPHY BRIAN;SILTRONIC AG 发明人 HAEBERLEN MAIK;MURPHY BRIAN
分类号 H01L21/30;H01L33/00;H01L33/46 主分类号 H01L21/30
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