发明名称 SPECTROSCOPIC MEASUREMENT METHOD, SPECTRAL MEASURING DEVICE, AND GENERATION METHOD FOR TRANSFORMATION MATRIX
摘要 PROBLEM TO BE SOLVED: To provide a spectroscopic measurement method, a spectral measuring device, and a generation method for a transformation matrix, which can accurately estimate a spectrum without being affected by an individual difference of the spectral measuring device and a measurement error.SOLUTION: A spectroscopic measurement method converts into a spectrum S by applying a transformation matrix Ms to a measuring spectrum D obtained by dispersing to a plurality of measurement wavelengths. The spectroscopic measurement method linearly projects the measuring spectrum D of known light on a linear space constituted of principal component vectors of the measuring spectrum obtained by a standard measuring instrument and converts into a standard known light measuring spectrum, and determines the transformation matrix. The spectroscopic measurement method determines so that a deviation between an estimated spectrum obtained by applying the transformation matrix to the standard known light measuring spectrum and a spectrum of known light (a known light spectrum) becomes an extreme value. Thus, spectral characteristics when dispersing the light to the measurement wavelengths and sensitivity characteristics when detecting the dispersed light or the like become unnecessary, so that a contamination of a measurement error is suppressed, and the spectrum can be accurately estimated from the measuring spectrum.
申请公布号 JP2013142657(A) 申请公布日期 2013.07.22
申请号 JP20120003914 申请日期 2012.01.12
申请人 SEIKO EPSON CORP 发明人 ARAI YOSHIFUMI
分类号 G01J3/26;G01J3/45 主分类号 G01J3/26
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