发明名称 SPECTACLE FITTING PARAMETER MEASUREMENT SYSTEM AND SPECTACLE FITTING PARAMETER MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a spectacle fitting parameter measurement system and spectacle fitting parameter measurement method capable of performing measurement with excellent reproducibility.SOLUTION: The spectacle fitting parameter measurement system is a system that includes an infrared light source (120) and two cameras (110R and 110L), and that makes a subject (300) wear a measurement spectacle (200) having a pair of optical elements and a frame holding the optical elements to measure a spectacle fitting parameter of the subject. Each optical element of the measurement spectacle or the frame thereof has markers marked at at least three locations, and a position of the marker is detected by each camera to calculate a three-dimensional position of a plane of each optical element. Further, a three-dimensional position of an eyeball center is measured by detecting infrared light on an eyeball surface of the subject with each camera. The spectacle fitting parameter is calculated on the basis of the three-dimensional position of the plane of each optical element and the three-dimensional position of the eyeball center.
申请公布号 JP2013142597(A) 申请公布日期 2013.07.22
申请号 JP20120002642 申请日期 2012.01.11
申请人 NIKON CORP 发明人 YAMARIKU YOSHIYUKI;KUNIGOME YUJI
分类号 G01B11/00;A61B3/113;G02C13/00 主分类号 G01B11/00
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