发明名称 PROBE UNIT AND INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To securely bring a pair of probe pins into contact with an object body to be probed.SOLUTION: A probe unit includes a pair of probe pins 13 and a pair of holding members 11 that hold the probe pins 13 at tip parts 11b respectively, and has base end parts 11a fitted to a fitting part body 71 of a fitting part 62a of a probing mechanism placing the respective probe pins 13 in a probing state, the tip parts 11b of the holding members 11 and the probe pins 13 being connected to each other by an elastic body 12.
申请公布号 JP2013137243(A) 申请公布日期 2013.07.11
申请号 JP20110288395 申请日期 2011.12.28
申请人 HIOKI EE CORP 发明人 MITSUKI HIDEHIKO;MURAYAMA RINTARO;SHIOIRI AKIHIRO
分类号 G01R1/073 主分类号 G01R1/073
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