| 摘要 |
PURPOSE: An infrared thermal image defect inspection device according to the thermal diffusivity is provided to rapidly detect defects existed inside a testing piece such as industrial materials or components having various thicknesses with a noncontact mode. CONSTITUTION: An infrared thermal image defect inspection device according to the thermal diffusivity includes a heat source (200) and an infrared camera (300). The heat source periodically provides heat to a testing piece (100). The infrared camera analyzes a heat flow supplied to the testing piece from the heat source based on the thermal diffusivity, thereby displaying the same with a two-dimensional thermal image (101). The heat source is a flash lamp transmitting heat pulses to the testing piece. [Reference numerals] (300) Infrared camera; (400) Data collection member; (500) Display member |
