| 摘要 |
PROBLEM TO BE SOLVED: To reliably achieve internal short-circuit in a contact probe by stabilizing a contact state between a plunger and a barrel.SOLUTION: A contact probe 11 includes: a first conductive contact part 16b brought into contact with an IC package; a conductive plunger 17 brought into contact with a wiring board; a conductive barrel body 16a with which the plunger 17 is movably engaged; and a spring 18 placed in the barrel body 16a and capable of elastically energizing the first contact part 16b and the plunger 17 in a mutually separating direction. Plate springs 16c to be abutted on the plunger 17 are formed on the barrel body 16a. |
