发明名称 ALIGNMENT MARK AND METHOD OF MANUFACTURING THE SAME
摘要 An alignment mark includes a plurality of mark units. Each mark unit includes a first element and a plurality of second elements. Each second element includes opposite first and second end portions. The plurality of second elements are arranged along a direction. The first element extends adjacent to the first end portions of the plurality of second elements and parallel to the direction of the plurality of second elements.
申请公布号 US2013161841(A1) 申请公布日期 2013.06.27
申请号 US201113333272 申请日期 2011.12.21
申请人 CHIANG CHEN KU;WU YUAN HSUN;NAN YA TECHNOLOGY CORPORATION 发明人 CHIANG CHEN KU;WU YUAN HSUN
分类号 H01L23/544;H01L21/308 主分类号 H01L23/544
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