Methods and apparatus for inspecting an object using structured light

摘要

A method (72) and apparatus for generating a mask (50,52) for use with a light measurement system (10) that includes a light source (22) for projecting light onto an object (12), and an imaging sensor (24) for receiving light reflected from the object. A profile (56) of the object to be inspected is determined and an electronic mask based on the determined object profile is generated. The electronic mask has an electronic opening (62,68) having a profile (64,70) defined to substantially match the determined object profile as viewed from one of the light source and the imaging sensor.