发明名称 METHOD OF MANUFACTURING GaN-BASED SEMICONDUCTOR DEVICE
摘要 A method of manufacturing a GaN-based semiconductor device includes the steps of: preparing a composite substrate including: a support substrate having a thermal expansion coefficient at a ratio of not less than 0.8 and not more than 1.2 relative to a thermal expansion coefficient of GaN; and a GaN layer bonded to the support substrate, using an ion implantation separation method; growing at least one GaN-based semiconductor layer on the GaN layer of the composite substrate; and removing the support substrate of the composite substrate by dissolving the support substrate. Thus, the method of manufacturing a GaN-based semiconductor device is provided by which GaN-based semiconductor devices having excellent characteristics can be manufactured at a high yield ratio.
申请公布号 US2013137220(A1) 申请公布日期 2013.05.30
申请号 US201213814037 申请日期 2012.03.26
申请人 MATSUBARA HIDEKI;ISHIHARA KUNIAKI;SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 MATSUBARA HIDEKI;ISHIHARA KUNIAKI
分类号 H01L21/50 主分类号 H01L21/50
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