发明名称 Methods and Apparatus for Hybrid MOS Capacitors in Replacement Gate Process
摘要 Methods and apparatus for hybrid MOS capacitors in replacement gate process. A method is disclosed including patterning a gate dielectric layer and a polysilicon gate layer to form a polysilicon gate region over a substrate; forming an inter-level dielectric layer over the substrate and surrounding the polysilicon gate region; defining polysilicon resistor regions each containing at least one portion of the polysilicon gate region and not containing at least one other portion of the polysilicon gate region, forming dummy gate regions removing the dummy gate regions and the gate dielectric layer underneath the dummy gate regions to leave trenches; and forming high-k metal gate devices in the trenches. A capacitor region including a high-k metal gate and a polysilicon gate next to the high-k metal gate is disclosed. Additional hybrid capacitor apparatuses are disclosed.
申请公布号 US2013126955(A1) 申请公布日期 2013.05.23
申请号 US201113303096 申请日期 2011.11.22
申请人 WANG PAI-CHIEH;HSIEH TUNG-HENG;HUANG YIMIN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WANG PAI-CHIEH;HSIEH TUNG-HENG;HUANG YIMIN
分类号 H01L29/94;H01L21/02 主分类号 H01L29/94
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