发明名称 RECESSED BOTTOM-ELECTRODE CAPACITORS AND METHODS OF ASSEMBLING SAME
摘要 <p>A capacitor-over-bitline structure includes a bottom electrode that has an open vessel form factor. The bottom-electrode form factor includes a floor, rectilinear sidewalls, and a rim that defines the topmost feature. A capacitor dielectric film contacts and covers the floor, the sidewalls, and the rim. A top electrode has a convex form factor that complements the concave bottom-electrode form factor. A process of forming the capacitor-over-bitline structure by spinning on a reflowable sacrificial material such as an oxide that covers both logic and memory portions of a semiconductive device, followed by a polish-back process and a recessing etch of the bottom electrode.</p>
申请公布号 WO2013070221(A1) 申请公布日期 2013.05.16
申请号 WO2011US60113 申请日期 2011.11.10
申请人 INTEL CORPORATION;BRAIN, RUTH A.;STEIGERWALD, JOSEPH M. 发明人 BRAIN, RUTH A.;STEIGERWALD, JOSEPH M.
分类号 H01L21/8242;H01L21/28;H01L27/108 主分类号 H01L21/8242
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