发明名称 |
CIRCUIT BOARD, ACTIVE MATRIX SUBSTRATE, DISPLAY DEVICE, AND MANUFACTURING METHOD OF CIRCUIT BOARD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a circuit board capable of accurately predicting a quality of an active element such as a TFT element equipped with an oxide semiconductor layer. <P>SOLUTION: An insulating substrate 2 is provided with a pattern for measuring a trap level 3, comprising: a first electrode 4; a second electrode 6 electrically separated from the first electrode 4; and an oxide semiconductor layer 5 formed so as to have contact with the first electrode 4 and the second electrode 6. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013093470(A) |
申请公布日期 |
2013.05.16 |
申请号 |
JP20110235378 |
申请日期 |
2011.10.26 |
申请人 |
SHARP CORP |
发明人 |
NIINO ATSUSHI |
分类号 |
H01L21/336;G02F1/13;G02F1/1345;G02F1/1368;H01L21/66;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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