发明名称 ANTISTATIC PHOTOMASK AND METHOD FOR MANUFACURING THE SAME
摘要 PURPOSE: An antistatic photomask is provided to prevent damages on the photomask in a light exposure step by removing fundamental causes of static electricity generation, thereby being capable of forming precise patterns. CONSTITUTION: An antistatic photomask comprises a glass substrate(10), a light-shielding film consisting of a non-light permeable material and a transparent conducting film(20). The transparent conducting film is formed between the glass substrate and a light-shielding film. The transparent conducting film is an indium tin oxide thin film. A manufacturing method of the antistatic photomask comprises a step of forming the transparent conducting film on the glass substrate; a step of forming a light-shielding film on the transparent conducting film; and a step of forming a photoresist film(40) on the light-shielding film.
申请公布号 KR20130044393(A) 申请公布日期 2013.05.03
申请号 KR20110096360 申请日期 2011.09.23
申请人 MICRO IMAGE CO., LTD. 发明人 RYU, CHANG KWON;LEE, HEE YOUNG
分类号 G03F1/40;G03F1/00 主分类号 G03F1/40
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