发明名称 LIFE ESTIMATION DEVICE, LIFE ESTIMATION METHOD AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To more precisely calculate a life of an electronic apparatus having a capacitor. <P>SOLUTION: A life estimation device for estimating a life of an electronic apparatus having a capacitor based on a relation expression indicating a relation between a temperature and a life of the capacitor comprises: an each-temperature retention time table for storing an estimated temperature of the capacitor of the electronic apparatus and a total time during which the capacitor is at the estimated temperature corresponding to each temperature; a first life calculation part for calculating the life of the capacitor at each estimated temperature using the relation expression; a deterioration degree calculation part for finding a multiplication value of an inverse number of the life calculated from the estimated temperature of the capacitor and the total time during which the capacitor is at the estimated temperature for each estimated temperature, and calculating a total value of the respective multiplication values as a deterioration degree of the capacitor; and a second life calculation part for calculating an inverse number of the deterioration degree as the life of the electronic apparatus. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013080787(A) 申请公布日期 2013.05.02
申请号 JP20110219443 申请日期 2011.10.03
申请人 FUJI ELECTRIC CO LTD 发明人 HAYASHI MASAKI
分类号 H01G13/00 主分类号 H01G13/00
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