发明名称 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND PATTERN FORMING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition having effect in improvement of tapered profile of a resist pattern and capable of forming a pattern with good LER performance, and to provide a pattern forming method using the composition. <P>SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition and a pattern forming method using the composition comprise: (A) resin in which solubility in an alkali developer by action of acid increases; and (B) a compound generating the acid by irradiation with an actinic ray or radiation. The actinic ray-sensitive or radiation-sensitive resin composition contains 10 to 30 mass% of (B) the compound generating the acid by the irradiation with the actinic ray or radiation on the basis of entire solid content of the actinic ray-sensitive or radiation-sensitive resin composition. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013080240(A) 申请公布日期 2013.05.02
申请号 JP20120262853 申请日期 2012.11.30
申请人 FUJIFILM CORP 发明人 TANGO NAOHIRO;SHIRAKAWA MICHIHIRO;FUJITA MITSUHIRO;YAMAGUCHI SHUHEI;SHIBUYA AKINORI;KATAOKA SHOHEI
分类号 G03F7/004;C08F220/28;G03F7/039;H01L21/027 主分类号 G03F7/004
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