发明名称 |
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND PATTERN FORMING METHOD USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition having effect in improvement of tapered profile of a resist pattern and capable of forming a pattern with good LER performance, and to provide a pattern forming method using the composition. <P>SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition and a pattern forming method using the composition comprise: (A) resin in which solubility in an alkali developer by action of acid increases; and (B) a compound generating the acid by irradiation with an actinic ray or radiation. The actinic ray-sensitive or radiation-sensitive resin composition contains 10 to 30 mass% of (B) the compound generating the acid by the irradiation with the actinic ray or radiation on the basis of entire solid content of the actinic ray-sensitive or radiation-sensitive resin composition. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013080240(A) |
申请公布日期 |
2013.05.02 |
申请号 |
JP20120262853 |
申请日期 |
2012.11.30 |
申请人 |
FUJIFILM CORP |
发明人 |
TANGO NAOHIRO;SHIRAKAWA MICHIHIRO;FUJITA MITSUHIRO;YAMAGUCHI SHUHEI;SHIBUYA AKINORI;KATAOKA SHOHEI |
分类号 |
G03F7/004;C08F220/28;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|