发明名称 CHARGED PARTICLE BEAM EXPOSURE SYSTEM AND BEAM MANIPULATING ARRANGEMENT
摘要 A beam manipulating arrangement for a multi beam application using charged particles comprises a multi-aperture plate having plural apertures traversed by beams of charged particles. A frame portion of the multi-aperture plate is heated to reduce temperature gradients within the multi-aperture plate. Further, a heat emissivity of a surface of the multi-aperture plate may be higher in some regions as compared to other regions in view of also reducing temperature gradients.
申请公布号 KR101258720(B1) 申请公布日期 2013.04.26
申请号 KR20087003887 申请日期 2006.07.20
申请人 发明人
分类号 H01J37/317;H01J37/36 主分类号 H01J37/317
代理机构 代理人
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