发明名称 LAYOUT PATTERN GENERATION DEVICE AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To easily generate layout patterns used for correctly verifying the validity of a design rule check. <P>SOLUTION: A graphics input section 24 accepts the input of an OK pattern that is generated so as to satisfy a predetermined drawing standard for a layout pattern of a semiconductor device. A reference position specification section 28 accepts, for the OK pattern, an input that specifies a part satisfying the drawing standard as a reference position. A verification pattern generation section 34 adds a predetermined change to the reference position of the OK pattern, thereby generating an NG pattern that does not satisfy the drawing standard. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013077263(A) 申请公布日期 2013.04.25
申请号 JP20110218094 申请日期 2011.09.30
申请人 LAPIS SEMICONDUCTOR CO LTD 发明人 SHIMIZU YUKIO
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址