发明名称 Diagnostic systems and methods utilizing probe-ions exhibiting photon avalanche effect
摘要 The present disclosure provides advantageous systems and methods for significantly increasing the sensitivity and selectivity for diagnostic procedures, e.g., optical biopsy. The disclosed systems and methods use a highly non-linear effect, the so-called photon avalanche. In the regime close to the avalanche threshold, small differences in density of the probe-ion under investigation or the excitation power can result in very large changes in up-conversion emission intensity. Through this effect, it becomes possible to accurately measure the signal of an optical biopsy probe-ion only in the location(s) where its concentration is highest, while at the same time significantly reducing or eliminating measurement of background signal from probe-ions distributed with a somewhat lower concentration throughout the measurement volume. Also background auto-fluorescence of the surrounding healthy tissue is essentially absent with this technique.
申请公布号 US8428695(B2) 申请公布日期 2013.04.23
申请号 US20070294961 申请日期 2007.03.19
申请人 SUIJVER JAN FREDERIK;KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 SUIJVER JAN FREDERIK
分类号 A61B6/00;A61B5/0476 主分类号 A61B6/00
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