发明名称 NANOIMPRINT METHOD AND NANOIMPRINT DEVICE FOR USE THEREIN AND MANUFACTURING METHOD OF PATTERNED SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To form a resist pattern having dimensions different from the pattern dimensions of a mold by a desired ratio in nanoimprint under some standard conditions. <P>SOLUTION: In a nanoimprint method, a resist 6 is hardened in a state where the pressure P in a pressure vessel 110 and/or the temperature of an assembly 8 are controlled so as to satisfy predetermined relational expressions on the basis of the ratio &Delta;D<SB POS="POST">all</SB>of dimensional difference of the resist pattern to reference dimensions, reference pressure P<SB POS="POST">st</SB>, reference temperature T<SB POS="POST">st</SB>, and Young's modulus E<SB POS="POST">m</SB>and coefficient of thermal expansion &alpha;<SB POS="POST">i</SB>of the mold, by using a mold 1 with a fine uneven pattern having predetermined reference dimensions at a predetermined reference pressure Pst and a predetermined reference temperature Tst being formed on the surface, and a processed substrate 7 where the Young's modulus and/or the coefficient of thermal expansion are different from each other. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013074258(A) 申请公布日期 2013.04.22
申请号 JP20110214420 申请日期 2011.09.29
申请人 FUJIFILM CORP 发明人 NAKAMURA KAZUHARU;WAKAMATSU TETSUSHI
分类号 H01L21/027;B29C59/02;G11B5/84 主分类号 H01L21/027
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