发明名称 Apparatus for reducing photodiode thermal gain coefficient and method of making same
摘要 An apparatus for reducing photodiode thermal gain coefficient includes a bulk semiconductor material having a light-illumination side. The bulk semiconductor material includes a minority charge carrier diffusion length property configured to substantially match a predetermined hole diffusion length value and a thickness configured to substantially match a predetermined photodiode layer thickness. The apparatus also includes a dead layer coupled to the light-illumination side of the bulk semiconductor material, the dead layer having a thickness configured to substantially match a predetermined thickness value and wherein an absolute value of a thermal coefficient of gain due to the minority carrier diffusion length property of the bulk semiconductor material is configured to substantially match an absolute value of a thermal coefficient of gain due to the thickness of the dead layer.
申请公布号 US8409908(B2) 申请公布日期 2013.04.02
申请号 US20090512714 申请日期 2009.07.30
申请人 LI WEN;SHORT JONATHAN D.;POSSIN GEORGE E.;GENERAL ELECTRIC COMPANY 发明人 LI WEN;SHORT JONATHAN D.;POSSIN GEORGE E.
分类号 H01L21/00 主分类号 H01L21/00
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