| 摘要 |
1,140,367. Ion sources. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. 21 March, 1967, No. 12371/66. Heading H1D. In a mass spectrometer solid sample ion source arrangement an insertion probe structure, demountably carrying at one end at least one solid sample, is introduced into the ionization chamber through a vacuum lock without breaking the vacuum, the ionization means is separate from the probe structure and a preliminary ion-etching cleansing action on the sample may be effected by a discharge in argon between the sample and an annular anode 9. The ionization means may comprise an external laser beam generator the laser beam entering the ionization chamber through a window, or, as in the arrangement shown, arc- or spark-electrode structures 11, 12. The probe structure 3 insertable through a rotary vacuum lock 5 of the type described in Specification 1,092,803 comprises an inner rod (shown in dotted outline) movable to an extent determined by a key K to effect a transfer of the sample holders 25, 26 to slotted electrode clips 15, 16. The sample holders 25, 26 are pivotally mounted on an end member 27 of the probe structure 3 and a withdrawal motion of the inner rod followed by a rotation causes eccentrically positioned projections 28b to displace the sample holders from upright positions into the positions shown. A subsequent movement of the probe structure lifts the pivots for the sample holders clear of the slots therein; the electrode structures 11, 12 can then be swung aside and the probe structure withdrawn. |
