发明名称 Systems and methods for mapping state elements of digital circuits for equivalence verification
摘要 Systems and methods for mapping state elements of digital circuits for equivalence verification are provided. One method for mapping state elements for equivalence verification between a first circuit and a second circuit includes (a) determining a first sequential depth from primary inputs and primary outputs of the first circuit and the second circuit to each state element thereof, wherein the first sequential depth is a minimum count of state elements along any path between two points of a circuit, (b) identifying and mapping first state elements of the first circuit and the second circuit having a unique first sequential depth, (c) determining a second sequential depth from the identified first state elements of the first circuit and the second circuit to the remaining state elements, (d) identifying second state elements of the first circuit and the second circuit having a unique second sequential depth, and (e) repeating (c) and (d) unless the process is no longer generating new unique mappings of state elements.
申请公布号 US8407639(B2) 申请公布日期 2013.03.26
申请号 US201113015504 申请日期 2011.01.27
申请人 REDEKOPP MARK W.;RAYTHEON COMPANY 发明人 REDEKOPP MARK W.
分类号 G06F9/455 主分类号 G06F9/455
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