发明名称 PROCESS FOR FABRICATING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING METAL OXIDE SEMICONDUCTOR DEVICE
摘要 A process for fabricating a semiconductor device is described. A silicon oxide layer is formed. A nitridation process including at least two steps is performed to nitridate the silicon oxide layer into a silicon oxynitride (SiON) layer. The nitridation process comprises a first nitridation step and a second nitridation step in sequence, wherein the first nitridation step and the second nitridation step are different in the setting of at least one parameter.
申请公布号 US2013072028(A1) 申请公布日期 2013.03.21
申请号 US201113237232 申请日期 2011.09.20
申请人 LIN CHIEN-LIANG;SUN TE-LIN;YEN YING-WEI;WANG YU-REN;UNITED MICROELECTRONICS CORP. 发明人 LIN CHIEN-LIANG;SUN TE-LIN;YEN YING-WEI;WANG YU-REN
分类号 H01L21/318 主分类号 H01L21/318
代理机构 代理人
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