发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device which is capable of recovering reliability of data holding characteristics. <P>SOLUTION: The semiconductor memory device according to an embodiment includes: a laminate in which a plurality of insulating films and a plurality of electrode films are alternately laminated; semiconductor pillars penetrating the laminate; charge storage layers provided between the electrode films and the semiconductor pillars; tunnel layers provided between the charge storage layers and the semiconductor pillars; separation grooves which are provided between the semiconductor pillars and separate the electrode films in one direction orthogonal to a laminating direction of the laminate; and a heating part provided inside the separation grooves. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013055185(A) |
申请公布日期 |
2013.03.21 |
申请号 |
JP20110191643 |
申请日期 |
2011.09.02 |
申请人 |
TOSHIBA CORP |
发明人 |
KITO TAKASHI;FUJIWARA TOMOKO;AOCHI HIDEAKI |
分类号 |
H01L21/8247;H01L21/336;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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