| 摘要 |
<p>An apparatus (20) for measuring a workpiece (24) includes a capacitance probe (36) mounted to a probe housing (34) and a non-conductive spacer (38). The capacitance probe includes a probe tip with a sensor surface (74) that emits an electric field (88). The non-conductive spacer (38) extends between a probe contact surface (82) and a workpiece contact surface (84). The probe contact surface (82) covers the sensor surface (74), and the workpiece contact surface contacts the workpiece (24) during the measuring of the workpiece (24).</p> |
