发明名称 Formation of devices by epitaxial layer overgrowth
摘要 Methods and structures are provided for formation of devices, e.g., solar cells, on substrates including, e.g., lattice-mismatched materials, by the use of aspect ratio trapping (ART) and epitaxial layer overgrowth (ELO). In general, in a first aspect, embodiments of the invention may include a method of forming a structure. The method includes forming a first opening in a masking layer disposed over a substrate that includes a first semiconductor material. A first layer, which includes a second semiconductor material lattice-mismatched to the first semiconductor material, is formed within the first opening. The first layer has a thickness sufficient to extend above a top surface of the masking layer. A second layer, which includes the second semiconductor material, is formed on the first layer and over at least a portion of the masking layer. A vertical growth rate of the first layer is greater than a lateral growth rate of the first layer and a lateral growth rate of the second layer is greater than a vertical growth rate of the second layer.
申请公布号 EP2528087(A3) 申请公布日期 2013.03.20
申请号 EP20120177269 申请日期 2009.09.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 FIORENZA, JAMES;LOCHTEFELD, ANTHONY;BAI, JIE;PARK, JI-SOO;HYDRICK, JENNIFER;LI, JIZHONG;ZHIYUAN, CHENG
分类号 H01L21/20;H01L21/02;H01L31/042;H01L31/0687;H01L31/18 主分类号 H01L21/20
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