发明名称 Microlithographic projection exposure apparatus
摘要 The disclosure relates to a microlithographic projection exposure apparatus, as well as related components and methods. In some embodiments, a microlithographic projection exposure apparatus includes an illumination system and a projection objective, where the illumination system can illuminate an object plane of the projection objective and the projection objective can produce the image of the object plane on an image plane. A polarization-dependent transmission can be produced in the illumination system such that, for at least one polarization distribution in respect of the light impinging on the object plane, a non-homogeneous intensity distribution in the object plane is obtained. The non-homogeneous intensity distribution can afford a homogeneous intensity distribution in the image plane by virtue of polarization-dependent transmission properties of the projection objective.
申请公布号 US8395753(B2) 申请公布日期 2013.03.12
申请号 US20100884485 申请日期 2010.09.17
申请人 FIOLKA DAMIAN;TOTZECK MICHAEL;PAZIDIS ALEXANDRA;RICKER MICHAEL;CARL ZEISS SMT GMBH 发明人 FIOLKA DAMIAN;TOTZECK MICHAEL;PAZIDIS ALEXANDRA;RICKER MICHAEL
分类号 G03B27/72;G03B27/54 主分类号 G03B27/72
代理机构 代理人
主权项
地址