发明名称 |
System and method for correcting sampling errors associated with radiation source tuning rate fluctuations in swept-wavelength interferometry |
摘要 |
The frequency-sampling method is widely used to accommodate nonlinear electromagnetic source tuning in swept-wavelength interferometric techniques, such as optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT). Two sources of sampling errors are associated with the frequency-sampling method. One source of error is the limit of an underlying approximation for long interferometer path mismatches and fast electromagnetic source tuning rates. A second source of error is transmission delays in data acquisition hardware. Aspects of the invention relate to a method and system for correcting sampling errors in swept-wavelength interferometry systems such that the two error sources correct sampling errors associated with the first radiation path and the second radiation path cancel to second order.
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申请公布号 |
US8392138(B2) |
申请公布日期 |
2013.03.05 |
申请号 |
US20090537003 |
申请日期 |
2009.08.06 |
申请人 |
MOORE ERIC D.;MCLEOD ROBERT R.;THE REGENTS OF THE UNIVERSITY OF COLORADO |
发明人 |
MOORE ERIC D.;MCLEOD ROBERT R. |
分类号 |
G01B9/02;G06F19/00 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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