发明名称 Method and system for optically inspecting parts
摘要 A method and apparatus that linearly scans at least one plane of radiation having a width wider than the diameter of the part onto an exterior side surface of the supported part so that the part occludes the at least one plane of radiation at a plurality of spaced apart locations. The invention includes forming a virtual representation of an outer profile of the part in a reference frame based on the input data and providing a virtual representation of an inner bore of a physical gauge in the reference frame. Then determining an interference position between the part and the gauge using the virtual representations wherein the interference position is a position along the axis where the bore diameter is substantially equal to the part diameter. Finally calculating a distance along the axis based on the interference position and storing the distance.
申请公布号 US8390826(B2) 申请公布日期 2013.03.05
申请号 US201113090314 申请日期 2011.04.20
申请人 WALSTRA ERIC M.;GII ACQUISITION, LLC 发明人 WALSTRA ERIC M.
分类号 G01B11/14;G01B11/08 主分类号 G01B11/14
代理机构 代理人
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