发明名称 |
Method and system for optically inspecting parts |
摘要 |
A method and apparatus that linearly scans at least one plane of radiation having a width wider than the diameter of the part onto an exterior side surface of the supported part so that the part occludes the at least one plane of radiation at a plurality of spaced apart locations. The invention includes forming a virtual representation of an outer profile of the part in a reference frame based on the input data and providing a virtual representation of an inner bore of a physical gauge in the reference frame. Then determining an interference position between the part and the gauge using the virtual representations wherein the interference position is a position along the axis where the bore diameter is substantially equal to the part diameter. Finally calculating a distance along the axis based on the interference position and storing the distance. |
申请公布号 |
US8390826(B2) |
申请公布日期 |
2013.03.05 |
申请号 |
US201113090314 |
申请日期 |
2011.04.20 |
申请人 |
WALSTRA ERIC M.;GII ACQUISITION, LLC |
发明人 |
WALSTRA ERIC M. |
分类号 |
G01B11/14;G01B11/08 |
主分类号 |
G01B11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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