发明名称 HETERODYNE INTERFERENCE LITHOGRAPHY APPARATUS, AND METHOD FOR FORMING MICRO-PATTERNS, WAFER, AND SEMICONDUCTOR DEVICE USING THE APPARATUS
摘要 <p>The present invention relates to a heterodyne interference lithography apparatus, and to a method for forming micro-patterns using same. More particularly, the present invention relates to an interference lithography apparatus and to a method for forming patterns, wherein the apparatus forms nanopatterns by causing interference using a laser capable of generating two or more wavelengths, and simultaneously forms micro-patterns by means of a beat phenomenon. To this end, disclosed is the heterodyne interference lithography apparatus, which comprises: a multi laser light source part (100) for generating laser beams having different wavelengths; a beam splitter (200) for transmitting or reflecting the laser beams; polarization inverting means (300) for inverting a polarized component of the transmitted laser beams; a beam expander (400) for expanding the inverted laser beams; and a pattern generating part (500) for forming a first pattern by causing the expanded laser beam and the reflection of the expanded laser beam to interfere with each other, and forming a second pattern by generating a new composite wave due to the wave interference caused by different wavelengths.</p>
申请公布号 WO2013027900(A1) 申请公布日期 2013.02.28
申请号 WO2011KR09928 申请日期 2011.12.21
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY;YANG, MIN-YANG;KANG, BONG-CHUL;LEE, JOO-HYUNG;KIM, GUN-WOO;NOH, JI-WHAN 发明人 YANG, MIN-YANG;KANG, BONG-CHUL;LEE, JOO-HYUNG;KIM, GUN-WOO;NOH, JI-WHAN
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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