发明名称 LOW TEMPERATURE MIGRATION ENHANCED Si-Ge EPITAXY WITH PLASMA ASSISTED SURFACE ACTIVATION
摘要 Epitaxial films are grown by alternately exposed to precursor dosing regions, inert gas plasma regions, hydrogen-containing plasma regions, chlorine-containing plasma and metrology regions, or regions where an atomic hydrogen source is located. Alternately, laser irradiation techniques may be substituted for the plasma energy in some of the processing regions. The film growth process can be implemented at substrate temperatures between about 25 C and about 600 C, together with optional exposures to laser irradiation to cause the surface of the film to melt or to experience a near-melt condition.
申请公布号 US2013045587(A1) 申请公布日期 2013.02.21
申请号 US201113212519 申请日期 2011.08.18
申请人 INTERMOLECULAR, INC.;KRAUS PHILIP A.;PRAMANIK DIPANKAR;BORISOV BORIS 发明人 KRAUS PHILIP A.;PRAMANIK DIPANKAR;BORISOV BORIS
分类号 H01L21/20 主分类号 H01L21/20
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