发明名称 METHOD FOR MAKING A DISILICIDE
摘要 Methods for fabricating a semiconductor device are disclosed. A metal-rich silicide and/or a mono-silicide is formed on source/drain (S/D) regions. A millisecond anneal is provided to the metal-rich silicide and/or the mono-silicide to form a di-silicide with limited spikes at the interface between the silicide and substrate. The di-silicide has an additive which can lower the electron Schottky barrier height.
申请公布号 US2013034944(A1) 申请公布日期 2013.02.07
申请号 US201213646429 申请日期 2012.10.05
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;TAIWAN SEMICONDUCTOR MANUFACTURING 发明人 NIEH CHUN-WEN;HSU HUNG-CHANG;TSAI WEN-CHI;WANG MEI-YUN;WU CHII-MING;LIN WEI-JUNG;CHANG CHIH-WEI
分类号 H01L21/336 主分类号 H01L21/336
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