发明名称 Method for producing group III nitride-based compound semiconductor
摘要 In the production of GaN through the flux method, deposition of miscellaneous crystals on the nitrogen-face of a GaN self-standing substrate and waste of raw materials are prevented. Four arrangements of crucibles and a GaN self-standing substrate are exemplified. In FIG. 1A, a nitrogen-face of a self-standing substrate comes into close contact with a sloped flat inner wall of a crucible. In FIG. 1B, a nitrogen-face of a self-standing substrate comes into close contact with a horizontally facing flat inner wall of a crucible, and the substrate is fixed by means of a jig. In FIG. 1C, a jig is provided on a flat bottom of a crucible, and two GaN self-standing substrates are fixed by means of the jig so that the nitrogen-faces of the substrates come into close contact with each other. In FIG. 1D, a jig is provided on a flat bottom of a crucible, and a GaN self-standing substrate is fixed on the jig so that the nitrogen-face of the substrate is covered with the jig. A flux mixture of molten gallium and sodium is charged into each crucible, and a GaN single crystal is grown on a gallium-face under pressurized nitrogen.
申请公布号 US8361222(B2) 申请公布日期 2013.01.29
申请号 US20080081943 申请日期 2008.04.23
申请人 TOYODA GOSEI CO., LTD.;NGK INSULATORS, LTD.;YAMAZAKI SHIRO;NAGAI SEIJI;SATO TAKAYUKI;IMAI KATSUHIRO;IWAI MAKOTO;SASAKI TAKATOMO;MORI YUSUKE;KAWAMURA FUMIO 发明人 YAMAZAKI SHIRO;NAGAI SEIJI;SATO TAKAYUKI;IMAI KATSUHIRO;IWAI MAKOTO;SASAKI TAKATOMO;MORI YUSUKE;KAWAMURA FUMIO
分类号 C30B15/14;C30B15/00;C30B21/06;C30B27/02;C30B28/10;C30B30/04 主分类号 C30B15/14
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