发明名称 |
PRESSURE MEASUREMENT DEVICE HAVING OPTIMIZED SENSITIVITY |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a MEMS having an optimized sensitivity and/or a MEMS pressure measurement device thereof. <P>SOLUTION: A pressure measurement device includes: a deformable film 4 which is stretched above a substrate 2 and one surface of the film is configured to receive a pressure to be measured; detection means 6 which is provided with a strain gauge, detects the deformation of the film 4, and is formed on the substrate 2; and a non-deformable arm 14 for transmitting the deformation of the film 4 to the detection means 6 with an amplified form. The arm 14 is hinged to the substrate 2 so as to be rotatable around an axial line Y substantially parallel to a surface of the film 4, and is integrated with the film to transmit the deformation of the film 4 to the detection means 6 with the amplified form. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013015524(A) |
申请公布日期 |
2013.01.24 |
申请号 |
JP20120148491 |
申请日期 |
2012.07.02 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE & AUX ENERGIES ALTERNATIVES |
发明人 |
ROBERT PHILIPPE;GUILLAUME JOURDAN |
分类号 |
G01L9/00;B81B3/00;B81C1/00;H01L29/84 |
主分类号 |
G01L9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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