发明名称 CHARGE TRAP MEMORY DEVICE COMPRISING COMPOSITE OF NANOPARTICLES AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>A charge trap type memory device and its manufacturing method are provided to prevent the aggregation of metallic nano grains and to obtain excellent retention characteristics by using an improved charge trap layer made of a nano grain composite with nano grains and insulating nano grains. A charge trap type memory device includes a substrate(11) and a gate structure on the substrate. The gate structure includes a charge trap layer(23). The charge trap layer is made of a nano grain composite. The nano grain composite of the charge trap layer consists of nano grains(23a) capable of trapping charge and insulating nano grains(23b).</p>
申请公布号 KR20070028240(A) 申请公布日期 2007.03.12
申请号 KR20060085295 申请日期 2006.09.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUN, SHIN AE;SEOL, KWNAG SOO;JANG, EUN JOO;LIM, JUNG EUN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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