| 摘要 |
A device for surveying an enclosed structure (10) includes a platform (24) configured to longitudinally traverse the structure (10), at least one first distance sensor (48) connected to the platform (24) and configured to measure a lateral distance between a point on the platform (24) and a wall of the structure (10), at least one second distance sensor (50) connected to the platform (24) and configured to measure a longitudinal distance between a point on the platform (24) and a first end of the structure (10), and a transport machine (22) configured to move the platform (24) substantially longitudinally within the structure (10). |
