发明名称 METHOD FOR ATOMIC LAYER DEPOSITION
摘要 PURPOSE: A method for depositing an atomic layer is provided to improve a throughput by continuously performing an annealing process in the same chamber. CONSTITUTION: A first deposition gas and a second deposition gas are successively supplied to a substrate. A thin film is deposited(S11). A first reaction material and a second reaction material are successively provided to the substrate on which the thin film is deposited. The thin film is reinforced by reacting with the reaction materials on the surface of the substrate(S12). An exothermic reaction is generated in the first and second reaction materials. [Reference numerals] (AA) Start; (BB) End; (S11) Thin film deposition; (S12) Thin film reinforcement
申请公布号 KR101220480(B1) 申请公布日期 2013.01.21
申请号 KR20110127638 申请日期 2011.12.01
申请人 K.C.TECH CO., LTD. 发明人 PARK, SUNG HYUN
分类号 H01L21/205 主分类号 H01L21/205
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