发明名称 INSPECTION DEVICE OF COMPONENT PARTS MOUNTED ON CIRCUIT BOARD AND INSPECTION METHOD OF COMPONENT PARTS MOUNTED ON CIRCUIT BOARD
摘要 <P>PROBLEM TO BE SOLVED: To provide an inspection device of component parts mounted on a circuit board capable of inspecting component parts to be inspected in which it is difficult to bring probes into contact with every electrode of the parts at a time. <P>SOLUTION: The inspection device includes: a measuring section 5 that measures an electric characteristic value Dm between desired two points on a circuit board 2; and a processing section 6 that inspects a capacitor 14 mounted between the two points on the basis of the electric characteristic value Dm. When inspecting the capacitor 14 one electrode 14a of which is connected to an output terminal 21b of a three-terminal regulator 21 and the other electrode 14b is connected to a conductor pattern 32, the measuring section 5 measures a first electric characteristic value Dm in a state that a measurement signal Vs, which is a DC voltage for actuating the three-terminal regulator 21 overlapped with an AC voltage of a frequency at which the ripple removal ratio becomes smaller than a reference value, is supplied between two points of an input terminal 21a and the conductor pattern 32, and the processing section 6 inspects the capacitor 14 on the basis of the first electric characteristic value Dm. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013007650(A) 申请公布日期 2013.01.10
申请号 JP20110140539 申请日期 2011.06.24
申请人 HIOKI EE CORP 发明人 TAKEUCHI GORO
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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