发明名称 THIN FILM TRANSISTOR DEVICE AND METHOD FOR PRODUCING THIN FILM TRANSISTOR DEVICE
摘要 <p>Provided is a thin film transistor device that has a suppressed kink phenomenon and superior TFT characteristics. The thin film transistor device is equipped with: a gate electrode (2) formed on a substrate (1); a gate insulating film (3) formed on the gate electrode (2); a crystalline silicon thin film (4) formed on the gate insulating film (3); a first semiconductor film (5) formed on the crystalline silicon thin film (4); a pair of second semiconductor films (6) formed on the first semiconductor film (5); a source electrode (8S) formed above one of the pair of second semiconductor films (6); and a drain electrode (8D) formed above the other of the pair of second semiconductor films (6). If the energy level of the bottom end of the conduction band of the crystalline silicon thin film (4) and of the first semiconductor film (5) is respectively ECP and EC1, then ECP C1.</p>
申请公布号 WO2013001676(A1) 申请公布日期 2013.01.03
申请号 WO2012JP00765 申请日期 2012.02.06
申请人 PANASONIC CORPORATION;PANASONIC LIQUID CRYSTAL DISPLAY CO., LTD.;KANEGAE, ARINOBU;KAWASHIMA, TAKAHIRO;HAYASHI, HIROSHI;KAWACHI, GENSHIROU 发明人 KANEGAE, ARINOBU;KAWASHIMA, TAKAHIRO;HAYASHI, HIROSHI;KAWACHI, GENSHIROU
分类号 H01L29/786;H01L21/20;H01L21/205;H01L21/336 主分类号 H01L29/786
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