发明名称 Method for manufacturing semiconductor device
摘要 An object is to manufacture a semiconductor device including an oxide semiconductor at low cost with high productivity in such a manner that a photolithography process is simplified by reducing the number of light-exposure masks. In a method for manufacturing a semiconductor device including a channel-etched inverted-stagger thin film transistor, an oxide semiconductor film and a conductive film are etched using a mask layer formed with the use of a multi-tone mask which is a light-exposure mask through which light is transmitted so as to have a plurality of intensities. The etching step is performed by wet etching in which an etching solution is used.
申请公布号 US8343799(B2) 申请公布日期 2013.01.01
申请号 US20090582084 申请日期 2009.10.20
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;ITO SHUNICHI;HOSOBA MIYUKI 发明人 ITO SHUNICHI;HOSOBA MIYUKI
分类号 H01L21/00;H01L21/16;H01L21/336;H01L21/8234;H01L21/84 主分类号 H01L21/00
代理机构 代理人
主权项
地址