发明名称 HIGH-RELIABILITY HIGH-SPEED MEMRISTOR
摘要 A memristor has a first electrode, a second electrode parallel to the first electrode, and a switching layer disposing between the first and second electrodes. The switching layer contains a conduction channel and a reservoir zone. The conduction channel has a Fermi glass material with a variable concentration of mobile ions. The reservoir zone is laterally disposed relative to the conduction channel, and functions as a source/sink of mobile ions for the conduction channel. In the switching operation, under the cooperative driving force of both electric field and thermal effects, the mobile ions are moved into or out of the laterally disposed reservoir zone to vary the concentration of the mobile ions in the conduction channel to change the conductivity of the Fermi glass material.
申请公布号 WO2012177265(A1) 申请公布日期 2012.12.27
申请号 WO2011US41881 申请日期 2011.06.24
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.;MIAO, FENG;YANG, JIANHUA;STRACHAN, JOHN PAUL;YI, WEI;RIBEIRO, GILBERTO MEDEIROS;WILLIAMS, R. STANLEY 发明人 MIAO, FENG;YANG, JIANHUA;STRACHAN, JOHN PAUL;YI, WEI;RIBEIRO, GILBERTO MEDEIROS;WILLIAMS, R. STANLEY
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址