发明名称 |
ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To estimate carbon atomicity more accurately. <P>SOLUTION: There is provided an analysis device which estimates carbon atomicity of fragment ions dissociated from an ionized sample by analyzing data acquired from a mass spectrometer. The analysis device includes: first carbon atomicity estimation means of estimating carbon atomicity of the fragment ions on the basis of a height ratio of adjacent peaks which are different by one in mass charge ratio of an MS/MS spectrum obtained from the sample; and second carbon atomicity estimation means of estimating carbon atomicity of the fragment ions on the basis of the extent of difference between the height ratio of adjacent peaks which are different by one in mass charge ratio of the MS/MS spectrum obtained from the sample and a height ratio of adjacent peaks which are different by one in mass charge ratio of an MS/MS spectrum obtained from a labeled sample obtained by imparting a substance whose carbon atomicity is known to the same or dissociating a substance whose carbon atomicity is known from the sample. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012251787(A) |
申请公布日期 |
2012.12.20 |
申请号 |
JP20110122511 |
申请日期 |
2011.05.31 |
申请人 |
SHISEIDO CO LTD |
发明人 |
KANEKO TSUNEAKI;MOTOYAMA AKIRA |
分类号 |
G01N27/62 |
主分类号 |
G01N27/62 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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