发明名称 |
MICRO-MACHINED IMAGING INTERFEROMETER |
摘要 |
<p>A micro-machined optical measuring device including: a set of photosensitive detector elements situated on a given face of a first support; a second support, assembled to the first support, forming a prism and including a first face through which a visible radiation is intended to penetrate and a second face, forming a non-zero angleθwith the first face and a non-zero angleαwith the given face of the first support, the second face being semi-reflective, the first support and the second support being positioned such that an interferometric cavity is made between the second face and the given face, the distance between the given face of the first support and the second face of the second support varying regularly.</p> |
申请公布号 |
EP2534455(A1) |
申请公布日期 |
2012.12.19 |
申请号 |
EP20110704045 |
申请日期 |
2011.02.07 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES;OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES |
发明人 |
FENDLER, MANUEL;LAFARGUES, GILLES;GUERINEAU, NICOLAS;ROMMELUERE, SYLVAIN;DE LA BARRIERE, FLORENCE |
分类号 |
G01J3/02;G01J3/26;G01J3/28;G01J3/453 |
主分类号 |
G01J3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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