| 摘要 |
The present invention relates to a probe apparatus for testing the quality of semiconductor chips, wherein the probe apparatus for testing the chips has superior reliability and durability. The probe apparatus of the present invention comprises: a printed circuit board having a center with a through-hole; a pin holder which is attached to the front surface of the printed circuit board and which has a plurality of pin holes; a plurality of probe pins each of which has an L-shape with a horizontal end connected to one side end of a circuit pattern formed on the printed circuit board, and a vertical end exposed outwardly from the upper surface of the pin hole; and a back cover attached to the back surface of the printed circuit board. |
