发明名称 METHOD AND APPARATUS FOR STRAIN MEASUREMENT USING OPTICAL PROPERTIES OF NANO MATERIALS
摘要 PURPOSE: A method and a device for measuring a strain using optical properties of a nano particle are provided to measure a strain of the nano particle by using an effect in which a color is changed when a distance between the nano particles is changed. CONSTITUTION: A method for measuring a strain using optical properties of a nano particle comprises next steps; a step(S601) for setting n strain values desired to perform a tensile test, a step(S602,S608) for setting the tensile test with a first strain value, a step(S603,S609) for transforming a polymer thin layer in which a nano particle thin film is not attached by a set strain, a step(S604,S610) for calculating photoluminescent spectrum and saving data by irradiating light energy to the transformed polymer thin film, a step(S605,S611) for deciding whether or not the tensile test is finished with the set strain value, a step(S606,S612) for setting the tensile test with a next strain value, a step(S607) for attaching generated nano particle thin film on the polymer thin film, a step(S613) for calculating a photoluminescent spectrum of only pure nano particle thin film from the calculated spectrum data and saving the data, and a step(s614) for step for calculating relation data(data for measuring the strain) between light peak frequency and the strain. [Reference numerals] (AA) Start; (BB) Finish; (S601) Setting n strain values desired to perform tensile test; (S602,S608) Setting tensile test with first strain value; (S603,S609) Transforming polymer thin layer in which nano particle thin film is not attached by set strain; (S604,S610) Calculating photoluminescent spectrum and saving data by irradiating light energy to transformed polymer thin film; (S605,S611) Finishing tensile test with set strain value?; (S606,S612) Setting tensile test with next strain value; (S607) Attaching generated nano particle thin film on polymer thin film; (S613) Calculating photoluminescent spectrum of only pure nano particle thin film from calculated spectrum data and saving the data; (S614) Step for calculating relation data(data for measuring the strain) between light peak frequency and strain
申请公布号 KR20120134910(A) 申请公布日期 2012.12.12
申请号 KR20110054131 申请日期 2011.06.03
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 LEE, SOON BOK;JANG, DONG WON
分类号 G01B11/16;G01N21/25 主分类号 G01B11/16
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