摘要 |
PURPOSE: A method and a device for measuring a strain using optical properties of a nano particle are provided to measure a strain of the nano particle by using an effect in which a color is changed when a distance between the nano particles is changed. CONSTITUTION: A method for measuring a strain using optical properties of a nano particle comprises next steps; a step(S601) for setting n strain values desired to perform a tensile test, a step(S602,S608) for setting the tensile test with a first strain value, a step(S603,S609) for transforming a polymer thin layer in which a nano particle thin film is not attached by a set strain, a step(S604,S610) for calculating photoluminescent spectrum and saving data by irradiating light energy to the transformed polymer thin film, a step(S605,S611) for deciding whether or not the tensile test is finished with the set strain value, a step(S606,S612) for setting the tensile test with a next strain value, a step(S607) for attaching generated nano particle thin film on the polymer thin film, a step(S613) for calculating a photoluminescent spectrum of only pure nano particle thin film from the calculated spectrum data and saving the data, and a step(s614) for step for calculating relation data(data for measuring the strain) between light peak frequency and the strain. [Reference numerals] (AA) Start; (BB) Finish; (S601) Setting n strain values desired to perform tensile test; (S602,S608) Setting tensile test with first strain value; (S603,S609) Transforming polymer thin layer in which nano particle thin film is not attached by set strain; (S604,S610) Calculating photoluminescent spectrum and saving data by irradiating light energy to transformed polymer thin film; (S605,S611) Finishing tensile test with set strain value?; (S606,S612) Setting tensile test with next strain value; (S607) Attaching generated nano particle thin film on polymer thin film; (S613) Calculating photoluminescent spectrum of only pure nano particle thin film from calculated spectrum data and saving the data; (S614) Step for calculating relation data(data for measuring the strain) between light peak frequency and strain
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